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Surface Cleaning/Contamination Handbook
from C.H.I.P.S.

Developments in Surface Contamination and Cleaning
Fundamentals and Applied Aspects
edited by Rajiv Kohli

Developments in Surface Contamination and Cleaning addresses the sources, detection, characterization and removal of both film-type and particulate contaminants, as well as ways to prevent surfaces from being contaminated.

A number of techniques to monitor the level of cleanliness are also discussed and a special emphasis is placed on the behavior of nanoscale particles throughout the book.

Features:

  • Excellent reference for a host of technologies and industries ranging from microelectronics to optics to automotive to biomedical
  • A single source document addressing everything from the sources of contamination to their removal and prevention
  • Well referenced and profusely illustrated

Contents

Fundamentals

  1. The Physical Nature of Very, Very Small Particles and its Impact on Their Behavior
  2. Elucidating the Fundamental Interactions of Very Small Particles: Ultrafast Science
  3. Transport and Deposition of Aerosol Particles
  4. Relevance of Particle Transport in Surface Deposition and Cleaning
  5. Tribological Implications of Particles
  6. Airborne Molecular Contamination: Contamination on Substrates and the Environment in Semiconductors and Other Industries
  7. Aspects of Particle Adhesion and Removal
  8. Relevance of Electrostatic Discharge Controls to Particle Contamination in Cleanroom Environments

Characterization of Surface Contaminants

  1. Electron Microscopy Techniques for Imaging and Analysis of Nanoparticles
  2. Surface Analysis Methods for Contaminant Identification
  3. Ionic Contamination and Analytical Techniques for Ionic Contamination
  4. Relevance of Colorimetric Interferometry for Thin Surface Film Contaminants
  5. Wettability Techniques to Monitor the Cleanliness of Surfaces

Methods for Removal of Surface Contamination

  1. The Use of Surfactants to Enhance Particle Removal from Surfaces
  2. Cleaning with Solvents
  3. Removal of Particles by Chemical Cleaning
  4. Cleaning Using High-Speed Impinging Jet
  5. Microabrasive Precision Cleaning and Processing Technology
  6. Cleaning Using Argon/Nitrogen Cryogenic Aerosols
  7. Carbon Dioxide Snow Cleaning
  8. Coatings for Preventing or Deactivation of Biological Contaminants
  9. A Detailed Study of Semiconductor Wafer Drying

Index

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Developments in Surface
Contamination and Cleaning

Fundamentals and Applied Aspects
edited by Rajiv Kohli

2006 • 234 pages • $294.00 + shipping
Texas residents please add 6.75 % sales tax

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